| dc.contributor.author | Lozano Galant, Fidel | |
| dc.contributor.author | Emadi, Seyyedbehrad | |
| dc.contributor.author | Komarizadehasl, Seyedmilad | |
| dc.contributor.author | González Arteaga, Jesús | |
| dc.contributor.author | Xia, Ye | |
| dc.contributor.author | Lozano Galant, José Antonio | |
| dc.date.accessioned | 2025-05-22T05:52:57Z | |
| dc.date.available | 2025-05-22T05:52:57Z | |
| dc.date.issued | 2024 | |
| dc.identifier.citation | Lozano-Galant, F., Emadi, S., Komarizadehasl, S., González Arteaga, J., Xia, Y. y Lozano-Galant, J. A. (2024). Long-term performance evaluation of low-cost sensors using AI-driven tools. 12th International Conference on Bridge Maintenance, Safety and Management, IABMAS 2024. Copenhague, Dinamarca. https://doi.org/10.1201/9781003483755-177 | es |
| dc.identifier.uri | http://hdl.handle.net/20.500.12251/3939 | |
| dc.description.abstract | In civil engineering and architectural applications, Micro Electro-Mechanical System (MEMS) accelerometer-based inclinometers are widely used due to their costeffectiveness. However, a major challenge associated with these devices is their long-term durab | es |
| dc.language.iso | eng | es |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
| dc.title | Long-term performance evaluation of low-cost sensors using AI-driven tools | es |
| dc.type | conferenceObject | es |
| dc.identifier.conferenceObject | 12th International Conference on Bridge Maintenance, Safety and Management, IABMAS 2024 | es |
| dc.identifier.doi | 10.1201/9781003483755-177 | |
| dc.identifier.url | https://doi.org/10.1201/9781003483755-177 | es |
| dc.page.initial | 1515 | es |
| dc.page.final | 1522 | es |
| dc.rights.accessRights | openAccess | es |
| dc.subject.keyword | Durabilidad | es |
| dc.subject.keyword | Inclinómetro | es |
| dc.subject.keyword | Sistemas dinámicos y control | es |
| dc.subject.unesco | 3311.02 Ingeniería de Control | es |
| dc.subject.unesco | 3311.17 Equipos de Verificación | es |
| dc.subject.unesco | 3311.07 Instrumentos Electrónicos | es |
| dc.subject.unesco | 3307.90 Microelectrónica | es |
| dc.subject.unesco | 3307.93 Microelectrónica. Diseño | es |